IMPROVED TEST STIMULUS SCAN-IN METHOD FOR INTEGRATED CIRCUITS
نویسندگان
چکیده
منابع مشابه
Test Time Optimization in Scan Circuits
As circuit sizes increase with scale down in technology, the time required to test the circuits also increases. Expensive automatic test equipment (ATE) is used to test these circuits and the cost of testing becomes a significant fraction of the total cost of the chip. Testing cost of a chip is directly related to the time its testing takes. However, test time cannot be reduced by simply applyi...
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The feasibility of generating high quality functional test vectors f o r sequential circuits using the Growth (G) and Disappearance ( 0 ) fault model has been demonstrated earlier. In this paper we provide a theoretical validation of the G and D fault model b y proving the ability of this model t o guarantee complete stuck fault coverage an combinational and sequential circuits synthesized empl...
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Current design methodologies and methodologies for reducing test data volume and test application time for full-scan circuits allow testing of multiple circuits (or subcircuits of the same circuit) simultaneously using the same test data. We describe a static compaction procedure that accepts test sets generated independently for multiple full-scan circuits, and produces a compact test set that...
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ژورنال
عنوان ژورنال: DYNA
سال: 2018
ISSN: 1989-1490
DOI: 10.6036/8788